美国耐诺Nanometrics
III-V族 化合物半导体制程控制 系统设备制造商,提供顶级设备检测,光电组件磊晶过程之杂值浓度纵向分布量测仪(ECV) 、数字深层瞬时光谱仪(DLTS) 、霍尔效应量测完整系统(Hall system) 、光谱图谱仪(PL) 、X射线衍射仪(x-ray) 、高速晶圆电阻系数分布图量测系统

NANOMETRICS BRINGS YOU THE BROADEST ARRAY OF ADVANCED METROLOGIES IN THE INDUSTRY.主要产品
Nanometrics’ product lines offer an extensive array of proprietary technologies in optics, software and systems integration designed to meet the process control requirements of today’s advanced semiconductor technologies. These process control solutions are implemented on common metrology platforms that can be configured with a variety of measurement technologies, or as a single technology targeted for a specific process control application.