德国MueTec
德国MueTec公司创建于1991年。通过同莱卡Leica Microsystems Semiconductor 公司多年的紧密合作，MueTec在掩膜CD测量方面创立了一套独有的标准。
MueTec is long-term successfully cooperating with Semiconductor global main-players, manufacturers of micro mechanic components and High Tech companies manufacturing microstructures.

MueTec’s main focus is the field of optical metrology (CD, Overlay, Film Thickness Measurement) as well as microscopic inspection including review.

MueTec cooperates with Vistec Semiconductor Systems GmbH (formerly Leica Microsystems Semiconductor) worldwide.

MueTec-employees know customers requirements and speak their language which enables MueTec to find qualified system solutions cooperating with customers.