Semiconsoft  
Semiconsoft, Inc.是世界上薄膜厚度分析软件和薄膜测量硬件解决方案的领导者。公司的TFCompanion软件被大多数的计量学公司以及国际知名的R&D组织采用，应用领域遍布半导体、生物技术、数据存储、显示、化学以及光学镀膜工业等。从最复杂的光谱学以及成像学椭偏仪到小而廉价的光纤光学发射计，我们的计量学仪器生产线集成了世界上最好的、最先进的硬件工艺，界面友好、功能强大而且简单易用。
成立于2001年的Semiconsoft公司坐落在麻省的Southborough，起初主要提供薄膜分析软件以及为半导体R&D以及生产公司提供服务，2002年公司开始生产TFCompanion软件，并且在这个领域始终持续保持前进的势头，不断增加新的功能，软件被公认为薄膜测量领域的领导者。2004年，公司发布了误差评估模块来预测不同测量环境下的测量精确度。2005年，公司与知名的硬件制造商合作，争取以系统集成的方式为客户的薄膜测量技术提供最优化的解决方案。

Semiconsoft, Inc.is a world leader in providing thin films data analysis software and thin-films measurement hardware solutions. Our TFCompanion software is used by many major metrology companies and leading R&D organizations, in semiconductor, biotechnology, data storage, display, chemistry and optical coating industries.Our line of metrology instruments from the most sophisticated spectroscopic and imaging ellipsometers to small and cost effective fiber-optics reflectometers combines the best and latest hardware technology with the user friendly, powerful, yet, easy to use software.

Semiconsoft, Inc. is a privately held company with headquarters in Southborough, Massachusetts. It was founded in 2001 with the mission to provide thin-film analysis software and services for semiconductor R&D and production. TFCompanion software was introduced in 2002. We continue active development of TFCompanion and constantly adding new features and capabilities. It is recognized as a leading thin-film data analysis software. One of the challenges of optical metrology, as an indirect measurement technique, is the selection of measurement methods and conditions to achieve optimal precision on specific application: this problem is faced by metrology manufacturers, production users or researchers alike. In 2004 we have introduced an ErrorEstimator module that allows to estimate accurately the measurement precision depending on measurement condition, application and technique. In 2005 we partnered with the leading hardware manufacturers to combine the recent advances in hardware and software and offer a full line of modular thin-film measurement solutions that can be customized for specific application. PicoProbe series of single wavelength and spectroscopic systems offer unparalleled speed and precision, PicoScan imaging ellipsometer system offer high spatial resolution, M-Probe spectral reflectometer systems offer small, precise and affordable solution for in-situ and ex-situ measurement, TR-Probe offer application customized high-precision reflectometer systems for the wide spectral range.