韩国Nano-View
韩国NanoView公司在椭偏仪领域不断创新，拥有多项专利技术。多年来一直致力于高性能椭偏仪的研制与生产，其产品主要用于半导体、导体、介质和液体薄膜的厚度、光学特性、成分比例和表面粗糙度等测量和分析，也可用于半导体器件和FPD显示等领域。目前主要产品分光椭偏仪，以独特的设计和无需校准等多项先进专利技术，使得测试时间大大减少的同时极大地增加了测量精度。
最新开发的多传感头的分光椭偏仪，用于半导体和显示器生产线的在线Mapping分析。
Nano-View is developing and producing the state of the art equipments that can measure and analyze the thickness, optical properties, composition ratio and the surface roughness of the semiconductor, conductor, dielectric and liquid thin films that are used in semiconductor devices, LCD display and solar cell.
Our current main products are the spectroscopic ellipsometers that can greatly reduce the measurement time and increase the accuracy as a result of our patented 'calibration and alignment free' method. High speed measurement is also possible by using a multichannel detector. We also reduced the size of the equipment greatly so that the foot print is minimal. The measurement and the analysis can be very easily done by simple and user-friendly software.