Repeatability max. white tile 0.03 DE*
Inter-instrument Agreement (SCI) 0.15 Avg. DE CIELAB
NetProfiler Support Yes
Reflectance apertures standard 25mm AND 10mm
SCE/SCI measurements Simultaneous
Instrument mounted measurement triggers Stand / Trial / Preview (programmable)
Instrument configuration setup Job Driven / User
Reflection sample preview Video with image capture & Door
Embedded transforms Enabled
Automated aperture plate detection Yes
Calibrated UV (D65) 400 cut-off
Wavelength Range 360-750nm
Measurement cycle time<3seconds
Effective Bandwidth / Data Interval 10nm
Photometric range 0% - 200%
Onboard instrument sensor reporting Temperature & humidity sensors
Measurement plane orientation Vertical and opt port up or down
Connectivity USB and Ethernet
Tracability NIST